Shared and Available Facilities for Physical Materials Imaging and Analysis
The list below shows the equipment or laboratory (and room) and the PI or technician last name.
Electron and Optical Microscopy
Equipment/Laboratory | PI/Technician | Room |
FEI Field Emission source SEM (with EDS, EBSD, and heating stage), (Scheduling: Schedules for FESEM in ETRL 153) | Amy Wo, Dave Field | ETRL 153 |
JEOL LaB6 source SEM (with EDS and EBSD) | Amy Wo, Dave Field | ETRL 121 |
Mechanical Testing
Equipment/Laboratory | PI/Technician | Room |
Hysitron Nanoindenter (with AFM capability and heating stage) | Amy Wo | ETRL 151 |
Rockwell and Vickers Hardness Testing | Amy Wo, Dave Field | ETRL 151 |
Charpy and Izod Impact Testing | Amy Wo, Dave Field | Dana 236 |
Tension-Compression load frames, Tension-Torsion Biaxial load frame, Creep tester | Lloyd Smith, Dave Field, I. Dutta | ETRL 122 |
Scanning Probe Microscopy
Equipment/Laboratory | PI/Technician | Room |
AFM with Peak Force QNM | Arda Gozen | ETRL 151 |
AFM | Nehal Abu Lail | Wegner 361 |
Specimen Preparation and Optical Microscopy
Equipment/Laboratory | PI/Technician | Room |
Specimen Cutting, Mounting, Grinding, Polishing | Amy Wo, Dave Field | ETRL 147, ETRL 149 |
Heat Treating Laboratory | Amy Wo, Dave Field | Dana 236 |
Optical Microscopy | Amy Wo, Dave Field | ETRL 150 |
Vibrational Spectroscopies, Thermal Analyzers, Etc.
Equipment/Laboratory | PI/Technician | Room |
Confocal Raman FTIR | Billy Schmuck | Wegner |
Magnetometer | John McCloy | ETRL 151 |
DSC | Mike Kessler | ETRL 322 |
TGA/TMA | Mike Kessler | ETRL 322 |
Electrochemical Analyzer | Min Kyu Song | ETRL 3xx |
Zygo Profilometer | I. Dutta | ETRL 152 |
X-Ray Instruments
Equipment/Laboratory | PI/Technician | Room |
X-Ray CT | B. Muhunthan | ETRL 16 |
XRD | John McCloy | ETRL 206 |
Analytical XRD | Billy Schmuck | Wegner xx |
Other Facilities
The facilities below contain multiple pieces of equipment for materials research.
Contact Us
Contact the Office of the Associate Dean for Research and Graduate Studies.